Inspection
OpTek Solutions
Where
- Inaccessible geometries
- Wrap-around surfaces
- High resolution measurements
- Measurements at small scales
- Low contrast objects
- Rigorous tracability of standards and calibration
- Calibrated illumination intensities or detector sensitivities
Inspection Techniques
- Optical imaging
- Fluorescence measurements including scanned laser induced fluorescence
- Spectroscopic measurement in all wavelengths
- Interferometry at physical dimensions down to 0.1mm
- Beam deviation measurements, including scanned areas
- Position sensitive detectors (PSDs)
- Sensitive optical detectors (photomultiplier (PM) tubes, diodes etc)
Innovative Inspection and Analysis
OpTek specializes in designing solutions for situations where 'standard' approaches are at their limit or not capable and a more sophisticated solution is required. We will work with you to identify the most appropriate approach to your application.
We provide inspection solutions either as stand alone equipment or integrasted with the production tools. OpTek machine often include integrated inspection systems, capable of giving live feedback for on-line QA or active process control to ensure process yields and maximise throughput.
Subject Imaging and measurement
OpTek utilizes and broad range of techniques for imaging the subject of interest and make suitable measurements.
Image Analysis
Bringing togehter image capture, process and analysis is all taken care of by our highly experienced engineers.
Visualize Complex Structures
OpTek specializes in providing inspection systems to the most challenging requirements, where off the shelf product fails to deliver the right result.
For more information on the above or to discuss your automation requirements in detail please contact us directly.